ArXiv TLDR

Size-Limited Room Temperature Single-Photon Emission from Sidewall-Treated Fractional Dimension InGaN Quantum Dots: Determined by Density-of-States-Corrected Ultrafast Carrier Dynamics and Improved Signal-to-Noise Ratio

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2604.27718

Pratim K. Saha

cond-mat.mes-hallphysics.opticsquant-ph

TLDR

This paper demonstrates room-temperature single-photon emission from size-limited and sidewall-treated InGaN quantum dots, optimized by carrier dynamics.

Key contributions

  • First demonstration of room-temperature single-photon emission from site-controlled InGaN QDs in GaN nanowires.
  • Analyzed diameter-dependent biexciton-exciton dynamics to determine optimal QD size for single-photon emission.
  • Improved single-photon purity by minimizing surface recombination through wet-treatment of QD sidewalls.
  • Developed a physical framework to predict single-photon emission probability based on QD surface and geometry.

Why it matters

This paper provides a crucial step towards practical quantum technologies by demonstrating high-purity room-temperature single-photon emission from InGaN QDs. It offers a generalized framework and practical methods to design next-generation semiconductor quantum dots.

Original Abstract

Room-temperature single-photon emission (SPE) resulting from a biexciton-exciton cascaded decay is demonstrated for the first time from chemically and photoelectrochemically etched site-controlled In0.14Ga0.86N quantum dots (QDs) embedded in vertical GaN nanowires. Diameter-dependent biexciton-exciton dynamics are analysed to determine the eligibility of QD as a single-photon emitter. The signal-to-noise ratio degrades with increasing QD diameter. Background noise photons pose a bottleneck to achieving SPE. This is also explained from a carrier dynamics perspective. Surface recombination contributes to inhomogeneous broadening at QD diameters larger than 35 nm. Below 35 nm, density-of-states-corrected Auger gradually becomes the principal biexciton-decay route with further reduction in QD diameter, thereby quenching the possibility of thermal broadening and setting a threshold for SPE. Below 9 nm, the Auger recombination rate becomes manyfold of other decay rates, causing multi-photon suppression via single Auger decay to form an exciton. Surface recombination probability of this exciton is minimized while biexciton state filling probability is maximized by reducing sidewall surface states through wet-treatment. These improve biexciton state preparation and enhance the single-photon purity of the exciton towards the exciton Bohr radius (3 nm) regime. Far away from this regime, higher-order autocorrelations to characterize quantum emission involving multi-photon events are discussed. This study establishes a generalized physical framework for predetermining SPE probability as a function of QD surface and geometry down to the exciton Bohr radius regime, with practical implementations. This work shows the pathway to design and develop next-generation semiconductor QDs for high-purity room-temperature SPE.

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